An overview of scanning near-field optical microscopy in characterization of nano-materials

	An overview of scanning near-field optical microscopy in characterization of nano-materials
Article 2, Volume 5, Issue 3, Summer 2014, Page 203-212 PDF (640 K)
Document Type: Review
DOI: 10.7508/ijnd.2014.03.001
Authors
Z. Sobat¹; S. Sadegh Hassani ²
¹Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran.
²Catalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: 1485733111, Tehran, Iran.
Abstract
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.
Keywords
Scanning Near-Field Optical Microscopy; Scanning probe microscope; Nano structures; Optical microscopy; Aperture less SNOM; Photon scanning tunneling microscopy; Optical fiber


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