Sobat, Z., Sadegh Hassani, S. (2014). An overview of scanning near-field optical microscopy in characterization of nano-materials. International Journal of Nano Dimension, 5(Issue 3), 203-212. doi: 10.7508/ijnd.2014.03.001
Z. Sobat; S. Sadegh Hassani. "An overview of scanning near-field optical microscopy in characterization of nano-materials". International Journal of Nano Dimension, 5, Issue 3, 2014, 203-212. doi: 10.7508/ijnd.2014.03.001
Sobat, Z., Sadegh Hassani, S. (2014). 'An overview of scanning near-field optical microscopy in characterization of nano-materials', International Journal of Nano Dimension, 5(Issue 3), pp. 203-212. doi: 10.7508/ijnd.2014.03.001
Sobat, Z., Sadegh Hassani, S. An overview of scanning near-field optical microscopy in characterization of nano-materials. International Journal of Nano Dimension, 2014; 5(Issue 3): 203-212. doi: 10.7508/ijnd.2014.03.001
An overview of scanning near-field optical microscopy in characterization of nano-materials
1Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran.
2Catalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: 1485733111, Tehran, Iran.
Abstract
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.